Workshops on organic semiconductor and organic electronics industry



Home Register Agenda Speakers Exhibition Sponsors Workshops Workshop 1.1 Workshop 1.2 Workshop 2.1 Workshop 2.2 Company tours Call for papers Travel and hotel Press Contact Why OEC-07? Perspectives		Workshop 2.1: Applications and Standards Workshop 2.1 is divided into two parts. Part 1 covers measurement and standardisation in organic electronics. Part 2 provides detailed analysis of printed RFID. Part 1: Organic Electronics: A review of measurement, characterisation and standardisation Workshop leader: Ian Gilmore, National Physics Laboratory 08:30-10:00 Monday 24 September 2007 This workshop will provide an overview and discussion of the measurement methods and techniques to characterise the material, nanochemical, optical and electronic properties of organic electronics in innovation, production and performance testing phases. The timeliness and needs for standards will be discussed. An overview of four key measurement areas will be presented: Materials properties Nanochemical analysis of surfaces and interfaces Optical properties Electronic properties The workshop will highlight and stimulate discussion on: Measurement requirements Measurement techniques and methods Measurement capability gaps and future developments Standards requirements The benefits Provide an overview of the state-of-the-art measurement methods and techniques for industry characterisation of organic electronics. Develop discussion on the role and need for standards in this emerging industry. Identify and discuss measurement gaps and future directions. Part 2: Printed RFID: Technical status, technology needs, and opportunities for success Workshop leader: Vivek Subramanian, University of California 10:30-12:00 Monday 24 September 2007 This workshop will cover: Review of RFID: standards, current practice, and opportunities Detailed analysis of printed RFID: devices, circuits, and architecture Cost analyses and market opportunities Attendees of this workshop will receive a detailed analysis of printed RFID status, challenges, and opportunities. An analysis of existing RFID standards and implementations will be used to establish a view of the viability of printed RFID. This analysis will be used to evaluate the state of the art in printed electronics as it applies to RFID. Based on this evaluation, an overview of challenges and opportunities will be provided. Attendees will thus gain a comprehensive view of where we are and where we are going in printed RFID from the perspective of materials, devices, circuits, and applications. How to book The workshops are open to delegates and non-delegates. See the registration page for prices and booking information.